HUANG, Ruiqian; ZHONG, Hongrui; YANG, Chenxi. Infrared Interference Thickness Inversion Based on Hilbert Analytic Signal and Full-Spectrum Phase Regression. Highlights in Science, Engineering and Technology, [S. l.], v. 163, p. 149–157, 2026. DOI: 10.54097/nr7c9563. Disponível em: http://hsetdata.org/index.php/ojs/article/view/51. Acesso em: 24 aug. 2026.